Mask Overview
All MueTec mask tools measure in a stepper like mode using VIS, UV-line or DUV-line illumination - and provide CATS™ compatibiliy.


MueTec 50
Semi-automatic measurement of masks, wafer and MEMS. Antivibration base frame is optionally available. MueTec 50 can be upgraded to MueTec 100.

MueTec 100 Leica LWM 100
Fully automatic measurement of masks, wafer and MEMS. Antivibration base frame is optionally available. MueTec 100 can be upgraded to MueTec 2000.

MueTec 2000
Fully automatic measurement of masks, wafers and MEMS. Antivibration base frame and rack for media controller and PCs included. System is designed for ultra high precision measurements.

MueTec <M5k> WI Leica LWM 500WI
Fully automatic measurement of masks using DUV-line illumination and Water immersion technique. System is designed for ultra high precision measurements for structures down to 0.1 micron.





MueTec is cooperating successfully with Vistec Semiconductor Systems GmbH (formerly Leica Microsystems Semiconductor) in this field since 1995. Since 2001 MueTec also uses Leica DUV optics in a microscope platform, invented by MueTec and offering highest mechanical stability and Z-resolution for metrology.

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