MueTec exhibits at SEMICON 2008:

• Semicon Europa, Stuttgart:  October 07 - 09, 2008     Booth 960 in Hall 1

MueTec presents:

• Defect Check 2x, 3x series: automated defect inspection on masks, wafers
• MueTec 50/100 semi-automatic CD and Overlay measurement of wafers, masks, MEMS.
• MueTec 3000 fully automatic Overlay, CD, and Film Thickness measurement on wafers.
• Upgrade possibilities of existing LWM, LWS systems for masks and wafers.