Take advantage of MueTec’s experience.
MueTec is long-term successfully cooperating with Semiconductor global main-players, manufacturers of micro mechanic components and High Tech companies manufacturing microstructures.

MueTec’s main focus is the field of optical metrology (CD, Overlay, Film Thickness Measurement) as well as microscopic inspection including review.

MueTec cooperates with Vistec Semiconductor Systems GmbH (formerly Leica Microsystems Semiconductor) worldwide.

MueTec-employees know customers requirements and speak their language which enables MueTec to find qualified system solutions cooperating with customers.


Overlay Metrology Tool: MueTec 3000 NT
DUV Mask Metrology: System MueTec <M5k>
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